• DocumentCode
    2145102
  • Title

    Near-Threshold Voltage design in nanoscale CMOS

  • Author

    De, Vivek

  • Author_Institution
    Circuits Research Lab, Intel Corporation, USA
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    612
  • Lastpage
    612
  • Abstract
    Summary form only given. New technologies have led to an “explosion” of data available to document states and processes in very many fields. Tools of data mining are being used to extract relevant information. If this information is used in decision making, analytical statistics can provide formal tests comparing the outcomes of different scenarios. Statistics has traditionally dealt with limited information, both in terms of observations and numbers of variables explaining the states of these observations. Virtually all statistical hypothesis testing was developed for such scenarios, trying to make sense from limited data, often expensive to produce. Clinical trials and the steps in development of drugs before those clinical trials are a typical examples from human medicine.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
  • Conference_Location
    Grenoble, France
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4673-5071-6
  • Type

    conf

  • DOI
    10.7873/DATE.2013.134
  • Filename
    6513580