DocumentCode
2145102
Title
Near-Threshold Voltage design in nanoscale CMOS
Author
De, Vivek
Author_Institution
Circuits Research Lab, Intel Corporation, USA
fYear
2013
fDate
18-22 March 2013
Firstpage
612
Lastpage
612
Abstract
Summary form only given. New technologies have led to an “explosion” of data available to document states and processes in very many fields. Tools of data mining are being used to extract relevant information. If this information is used in decision making, analytical statistics can provide formal tests comparing the outcomes of different scenarios. Statistics has traditionally dealt with limited information, both in terms of observations and numbers of variables explaining the states of these observations. Virtually all statistical hypothesis testing was developed for such scenarios, trying to make sense from limited data, often expensive to produce. Clinical trials and the steps in development of drugs before those clinical trials are a typical examples from human medicine.
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location
Grenoble, France
ISSN
1530-1591
Print_ISBN
978-1-4673-5071-6
Type
conf
DOI
10.7873/DATE.2013.134
Filename
6513580
Link To Document