DocumentCode
2145147
Title
Multiplexed trace signal selection using non-trivial implication-based correlation
Author
Prabhakar, Sandesh ; Hsiao, Michael S.
Author_Institution
Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
fYear
2010
fDate
22-24 March 2010
Firstpage
697
Lastpage
704
Abstract
Silicon debug with a trace buffer provides real-time visibility to the design under debug. It traces a small subset of internal signals during its normal operation. The effectiveness of silicon debug, then, depends critically on the selection of trace signals. This paper proposes a new multiplexer-based trace signal interconnection scheme and a new heuristic for trace signal selection based on implication-based correlation. As a result, we can effectively trace twice as many signals with the same trace buffer width. We also propose a SAT-based heuristic to prune the selected trace signal list further to take into account those multi-node implications. Finally, we propose a state restoration algorithm for the multiplexer-based trace signal interconnection scheme. Experiments for sequential benchmark circuits showed that the proposed approach selects the trace signals effectively, giving superior restoration percentage compared with other techniques.
Keywords
correlation methods; sequential circuits; signal restoration; silicon; SAT-based heuristic; multinode implications; multiplexed trace signal selection; multiplexer-based trace signal interconnection; nontrivial implication-based correlation; real-time visibility; sequential benchmark circuits; silicon debug; state restoration algorithm; superior restoration percentage; trace buffer; Buffer storage; Circuit testing; Clocks; Computer bugs; Integrated circuit interconnections; Integrated circuit testing; Manufacturing; Multiplexing; Signal restoration; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2010 11th International Symposium on
Conference_Location
San Jose, CA
ISSN
1948-3287
Print_ISBN
978-1-4244-6454-8
Type
conf
DOI
10.1109/ISQED.2010.5450503
Filename
5450503
Link To Document