• DocumentCode
    2145373
  • Title

    Worst-case noise prediction with non-zero current transition times for early power distribution system verification

  • Author

    Du, Peng ; Hu, Xiang ; Weng, Shih-Hung ; Shayan, Amirali ; Chen, Xiaoming ; Engin, A. Ege ; Cheng, Chung-Kuan

  • Author_Institution
    CSE Dept., Univ. of California, San Diego, CA, USA
  • fYear
    2010
  • fDate
    22-24 March 2010
  • Firstpage
    624
  • Lastpage
    631
  • Abstract
    A novel method of predicting the worst-case noise of a power distribution system is proposed in this paper. This method takes into account the effect of the transition time of load currents, and thus allows a more realistic worst-case noise prediction. A dynamic programming algorithm is introduced on the time-domain impulse response of the power distribution system, and a modified Knuth-Yao Quadrangle Inequality Speedup is developed which reduces the time complexity of the algorithm to O(nm log n), where n is the number of discretized current values and m is the number of zeros of the system impulse response. With the algorithm, the worst-case noise behavior of the power distribution system is investigated with respect to the transition time. Experimental results show that assuming a zero current transition time leads to an overly pessimistic worst-case noise prediction.
  • Keywords
    computational complexity; dynamic programming; power distribution; transient response; Knuth-Yao quadrangle inequality speedup; dynamic programming; early power distribution system verification; load currents; nonzero current transition time; system impulse response; time complexity; time-domain impulse response; worst-case noise behavior; worst-case noise prediction; Dynamic programming; Heuristic algorithms; Network-on-a-chip; Noise generators; Power distribution; Power grids; Power systems; Signal design; Time domain analysis; Voltage; power distribution system verification; transition time; worst-case noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2010 11th International Symposium on
  • Conference_Location
    San Jose, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4244-6454-8
  • Type

    conf

  • DOI
    10.1109/ISQED.2010.5450511
  • Filename
    5450511