• DocumentCode
    2145485
  • Title

    An express diagnostic method for ESD simulators and standardized ESD test stations

  • Author

    Kocharyan, Varurhan ; Tolman, Dave

  • Author_Institution
    Northwest EMC Inc., Hillsboro, OR, USA
  • Volume
    2
  • fYear
    2003
  • fDate
    18-22 Aug. 2003
  • Firstpage
    708
  • Abstract
    The management of ESD simulators and standardized ESD test stations to assure quality test results continues to be a major concern for test houses. Early detection of malfunctioning ESD equipment is possible if a day-to-day check is performed. The standard system for verification of ESD simulators is large, expensive and not practical for an everyday check. This paper describes the express diagnostic method aimed to locate the problems with either the ESD simulator or the test station. A 100MHz....500MHz bandwidth oscilloscope can be used to measure the quasi-electrostatic field of the horizontal coupling plane after the package of discharges has been applied. The malfunction of an ESD simulator and/or test station is discovered as a deviation from the baseline measurements, which are taken immediately after calibration. This method exposes any changes of the indicated discharge voltage or the horizontal coupling plane bleeder resistor impedance as well as changes in the discharge networks of ESD simulators. The oscillograms and the statistical analysis of data are presented in this paper, which support the claims that this method can assists in detection of potential problems of ESD equipment.
  • Keywords
    electrostatic discharge; statistical analysis; test equipment; 100 to 500 MHz; ESD simulators; ESD test equipment; baseline measurements; bleeder resistor impedance; diagnostic method; discharge networks; discharge voltage; electrostatic discharge; horizontal coupling plane; oscillograms; quasielectrostatic field; standardized ESD test stations; statistical analysis; test houses; Bandwidth; Calibration; Electrostatic discharge; Fault location; Oscilloscopes; Packaging; Quality management; Resistors; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2003 IEEE International Symposium on
  • Print_ISBN
    0-7803-7835-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2003.1236693
  • Filename
    1236693