DocumentCode
2145684
Title
On-line testing of permanent radiation effects in reconfigurable systems
Author
Cassano, Luca ; Cozzi, Dario ; Korf, Sebastian ; Hagemeyer, Jens ; Porrmann, Mario ; Sterpone, Luca
Author_Institution
Department of Information Engineering, University of Pisa, Italy
fYear
2013
fDate
18-22 March 2013
Firstpage
717
Lastpage
720
Abstract
Partially reconfigurable systems are more and more employed in many application fields, including aerospace. SRAM-based FPGAs represent an extremely interesting hardware platform for this kind of systems, because they offer flexibility as well as processing power. In this paper we report about the ongoing development of a software flow for the generation of hard macros for on-line testing and diagnosing of permanent faults due to radiation in SRAM-FPGAs used in space missions. Once faults have been detected and diagnosed the flow allows to generate fine-grained patch hard macros that can be used to mask out the discovered faulty resources, allowing partially faulty regions of the FPGA to be available for further use.
Keywords
Circuit faults; Fabrics; Field programmable gate arrays; Generators; Software; Test pattern generators; Automatic Test Pattern Generation; Fault Diagnosis; On-Line Testing; Permanent Radiation Effects; SRAM-FPGA;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location
Grenoble, France
ISSN
1530-1591
Print_ISBN
978-1-4673-5071-6
Type
conf
DOI
10.7873/DATE.2013.154
Filename
6513600
Link To Document