• DocumentCode
    2145684
  • Title

    On-line testing of permanent radiation effects in reconfigurable systems

  • Author

    Cassano, Luca ; Cozzi, Dario ; Korf, Sebastian ; Hagemeyer, Jens ; Porrmann, Mario ; Sterpone, Luca

  • Author_Institution
    Department of Information Engineering, University of Pisa, Italy
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    717
  • Lastpage
    720
  • Abstract
    Partially reconfigurable systems are more and more employed in many application fields, including aerospace. SRAM-based FPGAs represent an extremely interesting hardware platform for this kind of systems, because they offer flexibility as well as processing power. In this paper we report about the ongoing development of a software flow for the generation of hard macros for on-line testing and diagnosing of permanent faults due to radiation in SRAM-FPGAs used in space missions. Once faults have been detected and diagnosed the flow allows to generate fine-grained patch hard macros that can be used to mask out the discovered faulty resources, allowing partially faulty regions of the FPGA to be available for further use.
  • Keywords
    Circuit faults; Fabrics; Field programmable gate arrays; Generators; Software; Test pattern generators; Automatic Test Pattern Generation; Fault Diagnosis; On-Line Testing; Permanent Radiation Effects; SRAM-FPGA;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
  • Conference_Location
    Grenoble, France
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4673-5071-6
  • Type

    conf

  • DOI
    10.7873/DATE.2013.154
  • Filename
    6513600