• DocumentCode
    2147190
  • Title

    Analysis of insulator surface charging due to charge injection and secondary electron emission in vacuum

  • Author

    Zhang, Guan-Jun ; Wen-Bin Zhao ; Yan, Zhang

  • Author_Institution
    Sch. of Electr. Eng., Xi´´an Jiaotong Univ., China
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    622
  • Lastpage
    625
  • Abstract
    During the developing process of flashover across an insulator in vacuum, the insulator surface is usually charged. It is of great importance to analyze the charging phenomena for better understanding the flashover characteristics in vacuum. It is considered that there are two kinds of mechanisms closely related to the surface charging phenomena of insulating materials, i.e., the classical secondary electron emission occurring over an insulator, and charge injection and accumulation occurring inside an insulator. Based on the rigorous analysis of the kinetic processes of both primary and secondary electrons, the related surface charges were analyzed. In this process, the influence of image force of mirror charge was taken into account. Involving the detrapping of charges trapped and the recombination of charges injected, the charging process due to charge injection and accumulation was also deduced theoretically. Some formulas were given to express the density of surface charges.
  • Keywords
    flashover; insulators; secondary electron emission; surface charging; surface discharges; vacuum breakdown; charge accumulation; charge injection; charges detrapping; flashover characteristics; image force; insulator surface charging; kinetic processes; mirror charge; primary electrons; secondary electron emission; secondary electrons; surface charges density; vacuum; Acceleration; Cathodes; Dielectrics and electrical insulation; Electrodes; Electron emission; Flashover; Kinetic theory; Mirrors; Surface charging; Surface discharges;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 2002. 20th International Symposium on
  • Print_ISBN
    0-7803-7394-4
  • Type

    conf

  • DOI
    10.1109/ISDEIV.2002.1027451
  • Filename
    1027451