Title :
Suppression of intersubband transition by applied electrical fields in AlN/GaN coupled double quantum wells
Author :
Cen, L.B. ; Shen, B. ; Qin, Z.X. ; Zhang, G.Y.
Author_Institution :
State Key Lab. of Artificial Microstruct. & Mesoscopic Phys., Peking Univ., Beijing, China
Abstract :
The influences of applied electrical fields on the absorption coefficient and subband energy distances of intersubband transitions (ISBTs) in AlN/GaN coupled double quantum wells (CDQWs) have been investigated by solving the Schrodinger and Poisson equations self-consistently. It is found that the absorption coefficient of the ISBT between the ground state and the second excited state (1odd-2odd) can be equal to zero when the electrical fields are applied in AlN/GaN CDQWs, which is related to applied electrical fields induced symmetry recovery of these states. Meanwhile, the energy distances between 1odd-2odd and 1even-2odd subbands have different relationships from each other with the increase of applied electrical fields due to the different polarization-induced potential drops between the left and the right wells. The results indicate that an electrical-optical modulator operated within the opto-communication wavelength range can be realized in spite of the strong polarization-induced electrical fields in AlN/GaN CDQWs.
Keywords :
III-V semiconductors; Poisson equation; Schrodinger equation; absorption coefficients; aluminium compounds; excited states; gallium compounds; ground states; semiconductor quantum wells; wide band gap semiconductors; AlN-GaN; Poisson equation; Schrodinger equation; absorption coefficient; coupled double quantum wells; electrical-optical modulator; ground state; intersubband transition; opto-communication wavelength; polarization-induced potential drops; second excited state; self-consistent method; subband energy distances; Absorption; Electrons; Elementary particle vacuum; Gallium arsenide; Gallium nitride; Physics; Poisson equations; Polarization; Relativistic quantum mechanics; Stationary state;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
DOI :
10.1109/ICSICT.2008.4734733