DocumentCode :
2148645
Title :
New three-dimensional integration technology using reconfigured wafers
Author :
Koyanagi, Mitsumasa ; Fukushima, Takafumi ; Tanaka, Tetsu
Author_Institution :
Dept. of Bioeng. & Robot., Tohoku Univ., Sendai, Japan
fYear :
2008
fDate :
20-23 Oct. 2008
Firstpage :
1188
Lastpage :
1191
Abstract :
We have proposed a new three-dimensional (3D) integration technology based on reconfigured wafer-on-wafer bonding technique to solve several problems in 3D integration technology using the conventional wafer-on-wafer bonding technique. 3D LSIs are fabricated by bonding the reconfigured wafers onto the supporting Si wafer. The reconfigured wafer consists of many known good dies (KGDs) which are arrayed and glued on a holding Si wafer with Si steps by chip self-assembly technique. Therefore, the yield of the reconfigured wafer can be 100 %. As a result, we can obtain a high production yield even after bonding many wafers. In addition, it is not necessary in the reconfigured wafer that the chip size has to be identical within the wafer. Therefore, we can stack various kinds of chips with different chip sizes, different materials and different devices in our new 3D integration technology based on the configured-wafer-on-wafer bonding technique (Reconfig. W-on-W 3D technology).
Keywords :
wafer bonding; 3D integration technology; chip self-assembly; chip size; configured-wafer-on-wafer bonding; reconfigured wafers; Biomedical engineering; Capacitance; Large scale integration; Production; Robots; Self-assembly; Signal processing; Throughput; Wafer bonding; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
Type :
conf
DOI :
10.1109/ICSICT.2008.4734759
Filename :
4734759
Link To Document :
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