Title :
Single Event Transient (SET) Susceptibility of the Texas Instruments LM139 Quad Comparator under Proton Irradiation
Author :
Gaza, Razvan ; Cooper, Joshua
Author_Institution :
IS&GS, Lockheed Martin, Houston, TX, USA
Abstract :
Proton Single Event Transient (SET) data are presented for the Texas Instruments (National Semiconductor) LM139AxQMLV (5962R9673801VxA).
Keywords :
Texas Instruments computers; microcomputers; SET susceptibility; Texas Instruments LM139 quad comparator; proton irradiation; proton single event transient data; single event transient susceptibility; Aerospace electronics; Protons; Radiation effects; Single event transients; Space vehicles; Testing; Transient analysis;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-1136-3
DOI :
10.1109/REDW.2013.6658213
