• DocumentCode
    2149556
  • Title

    Single-Event Effect Qualification of 24 Bit Analog-to-Digital Converters

  • Author

    Scheick, Leif Z. ; Allen, G.R. ; Edmonds, Larry D.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2013
  • fDate
    8-12 July 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The qualification efforts and results for three 24 bit analog-to-digital converters (ADCs) are presented. These devices demonstrate a noticeable advancement in radiation hardness for the technology with two of the devices exhibiting no Single-Event Latchup.
  • Keywords
    analogue-digital conversion; ADC; analog-to-digital converters; single-event effect qualification; single-event latchup; Conferences; Laboratories; Propulsion; Radiation effects; Registers; Software;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2013 IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4799-1136-3
  • Type

    conf

  • DOI
    10.1109/REDW.2013.6658215
  • Filename
    6658215
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2149556