• DocumentCode
    2149668
  • Title

    Atomistic simulation of electron and phonon transport in nano-devices

  • Author

    Luisier, Mathieu ; Rhyner, R.

  • Author_Institution
    Integrated Syst. Lab., ETH Zurich, Zürich, Switzerland
  • fYear
    2013
  • fDate
    16-20 Sept. 2013
  • Firstpage
    308
  • Lastpage
    313
  • Abstract
    In this paper, the electrical, thermal, and coupled electro-thermal properties of silicon nanowire field-effect transistors (NWFETs) are investigated through advanced numerical simulations. An atomistic quantum transport solver based on the Non-equilibrium Green´s Function (NEGF) formalism is utilized as modeling tool. The electron characteristics are treated within an empirical tight-binding basis, while a modified valence-force-field method is used to describe phonons. Device simulations going beyond the ballistic limit of transport are performed: electron-phonon interactions with an equilibrium and out-of-equilibrium phonon population are considered as well as an-harmonic phonon-phonon scattering. It is found that ultrascaled Si NWFETs with a gate length of 15 nm operate at about 50% of their ballistic limit. This poor performance can be explained by large self-heating effects that drastically increase the lattice temperature and thus reduce the drain current.
  • Keywords
    Green´s function methods; electron transport theory; electron-phonon interactions; elemental semiconductors; field effect transistors; nanowires; phonon-phonon interactions; silicon; NEGF formalism; Si; atomistic quantum transport solver; ballistic limit; coupled electrothermal properties; electron characteristics; electron-phonon interactions; empirical tight-binding basis; harmonic phonon-phonon scattering; large self-heating effects; lattice temperature; modified valence-force-field method; nonequilibrium Green´s Function formalism; out-of-equilibrium phonon population; silicon nanowire field-effect transistors; size 15 nm; ultrascaled Si NWFET; Lattices; Logic gates; Phonons; Scattering; Silicon; Sociology; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference (ESSDERC), 2013 Proceedings of the European
  • Conference_Location
    Bucharest
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2013.6818880
  • Filename
    6818880