• DocumentCode
    2149929
  • Title

    Exponentially-decaying traveling-wave resonators by coupled positive-index/negative-index guides

  • Author

    Mirzaei, Hassan ; Eleftheriades, George V.

  • Author_Institution
    Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
  • fYear
    2012
  • fDate
    8-14 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A traveling-wave resonator is presented which is created by the radial arrangement of two or more branches of coupled positive-index/negative-index guides. In each branch, a microstrip line (representing the positive-index line) is coupled to another microstrip line which is loaded with series capacitors and shunt inductors (representing the negative-index line). This resonator features some distinct properties. It exhibits multiple resonant frequencies and their number increases with the number of branches. In contrast to the traditional traveling-wave resonator, these resonant frequencies are not harmonically related. At each resonant frequency, the electromagnetic fields are stronger at the connection point and exhibit exponential decay along each branch. Moreover, the performance of the coupler can be made independent from the length of the branches. This resonator can be employed in multiband antennas, sensors and filter applications.
  • Keywords
    capacitors; coupled transmission lines; electromagnetic fields; inductors; microstrip lines; microstrip resonators; multifrequency antennas; coupled negative index guide; coupled positive index guide; electromagnetic field; exponential decay; filter; microstrip line; multiband antenna; radial arrangement; resonant frequency; sensor; series capacitor; shunt inductor; traveling wave resonator; Frequency measurement; Microstrip; Microwave antennas; Resonant frequency; Sensors; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4673-0461-0
  • Type

    conf

  • DOI
    10.1109/APS.2012.6348903
  • Filename
    6348903