Title :
Proposed chapter 9 for predicting voltage sags (dips) in revision to IEEE Std 493, the gold book
Author :
Becker, Carl ; Braun, William, Jr. ; Carrick, Kenneth ; Diliberti, Tom ; Grigg, Cliff ; Groesch, Joe ; Hazen, Bill ; Imel, Tom ; Koval, Don ; MUELLER, David ; St.John, T. ; Conrad, Larry E.
Author_Institution :
PSI Energy, Plainfield, IN, USA
Abstract :
Voltage sags, also known as dips, are important to industrial reliability. Modern process controls are often sensitive to voltage sags. The combination of voltage sags and sensitive equipment may cause significant production outages. Less sensitive equipment may be available, but the designer must know sag characteristics of the electric system to make the best choices between reliability and equipment cost. This paper shows how to predict voltage sag performance of electric supply systems by combining a new analysis method with reliability data. The analysis method is proposed for a new chapter in the next revision of IEEE Std 493
Keywords :
electrical faults; power supply quality; power system reliability; standards; IEEE Std 493; equipment cost; guidelines; industrial power system reliability; performance; process controls; sensitive equipment; voltage dips; voltage sags; Books; Circuit analysis computing; Circuit faults; Electrical equipment industry; Electronics packaging; Gold; Power quality; Power system reliability; Production; Voltage fluctuations;
Conference_Titel :
Transmission and Distribution Conference, 1994., Proceedings of the 1994 IEEE Power Engineering Society
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1883-8
DOI :
10.1109/TDC.1994.328354
