Title :
Self-consistent solution of 2D-Poisson and Schrodinger wave equation for nano-metric MOSFET modeling for VLSI/ULSI purposes
Author :
Dasgupta, S. ; Jain, D.
Author_Institution :
Dept. of Electron., Indian Sch. of Mines, Dhanbad, India
Abstract :
A numerical solution of two-dimensional Poisson´s equation and Schrodinger wave equation of a deep sub-micron and nano-meter MOSFET has been obtained to gather information about the charge and the potential distribution in the depletion region. The quantum as well as classical charge has been computed. The quantum charge is a direct function of Density of States (DOS). The classical charge can be found out by simply solving the two-dimensional Poisson equation under specific boundary conditions governed by the physics of the device. The channel voltage profile has also been presented. It is seen that the classical model underestimates the channel voltage and the longitudinal electric field in the channel as compared to that obtained through Quantum Mechanical (QM) approach.
Keywords :
MOSFET; Poisson equation; Schrodinger equation; ULSI; VLSI; electronic density of states; nanotechnology; semiconductor device models; 2D-Poisson wave equation; Schrodinger wave equation; VLSI/ULSI purposes; boundary conditions; channel voltage; channel voltage profile; charge distribution; classical charge; density of states; longitudinal electric field; nanometer MOSFET; nanometric MOSFET modeling; potential distribution; quantum charge; quantum mechanical approach; selfconsistent solution; submicron MOSFET; two-dimensional Poisson equation; Boundary conditions; MOSFET circuits; Partial differential equations; Physics; Poisson equations; Quantum computing; Quantum mechanics; Ultra large scale integration; Very large scale integration; Voltage;
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2002 Conference on
Print_ISBN :
0-7803-7571-8
DOI :
10.1109/COMMAD.2002.1237269