• DocumentCode
    2155162
  • Title

    Self-calibration of digital phase-locked loops

  • Author

    Veillette, Benoît R. ; Roberts, Gordon W.

  • Author_Institution
    Microelectron & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
  • fYear
    1997
  • fDate
    5-8 May 1997
  • Firstpage
    49
  • Lastpage
    52
  • Abstract
    A novel method for the measurement of the jitter transfer function of digital phase-locked loops is presented. The signal generation and analysis circuits are entirely digital except for an extra charge-pump. They hence do not require calibration. Contrary to other phase-locked loop digital measurement schemes, a clock frequency larger than the phase-locked loop operating frequency is not necessary. Because the area overhead is small, our scheme is highly amenable to on-chip tuning of analog components for compliance to specifications. This method could also be used to implement built-in self-test for phase-locked loops. Experiments with discrete components show the jitter transfer function measuring method is sound
  • Keywords
    built-in self test; calibration; circuit tuning; clocks; digital phase locked loops; jitter; transfer functions; area overhead; built-in self-test; clock frequency; digital phase-locked loops; jitter transfer function; on-chip tuning; self-calibration; signal generation; Calibration; Charge pumps; Circuit analysis; Frequency measurement; Jitter; Phase locked loops; Phase measurement; Signal analysis; Signal generators; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1997., Proceedings of the IEEE 1997
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    0-7803-3669-0
  • Type

    conf

  • DOI
    10.1109/CICC.1997.606583
  • Filename
    606583