• DocumentCode
    2155471
  • Title

    Variable dielectric constants by structured porosity for passive ceramic components

  • Author

    She, Wing Han ; Wing, Zach N. ; Halloran, John W. ; Chappell, William J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2005
  • fDate
    12-17 June 2005
  • Abstract
    In this paper, different densities within a ceramic are used to provide a wide, continuous range of cofirable dielectric constants for high frequency applications. Cofiring different ceramic materials together to make a single, unified structure to obtain different dielectric constant combinations is quite difficult due to phase stability issues and shrinkage mismatches. However, using various levels of porosity in order to alter the effective dielectric constant in the same material allows cofiring of different dielectric constants into a single unit. Since the structure is made from a single material, the varying porosities can be made compatible. Large scale aligned porosity using a microcellular structure allows for an extremely wide range of dielectric constants, ranging from 90 to 9.15, while maintaining a low loss tangent. Examples using the cofiring of the different density ceramics include a stratified medium cavity resonator and a buried dielectric resonator internal to a microcellular substrate.
  • Keywords
    cavity resonators; ceramics; dielectric resonators; permittivity; porosity; porous materials; cavity resonator; ceramic materials; dielectric constants; dielectric measurements; dielectric resonator; large scale aligned porosity; microcellular structure; microcellular substrate; passive ceramic components; phase stability; structured porosity; Cavity resonators; Ceramics; Dielectric constant; Dielectric losses; Dielectric materials; Dielectric substrates; Frequency; High-K gate dielectrics; Large-scale systems; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2005 IEEE MTT-S International
  • ISSN
    01490-645X
  • Print_ISBN
    0-7803-8845-3
  • Type

    conf

  • DOI
    10.1109/MWSYM.2005.1516755
  • Filename
    1516755