• DocumentCode
    2155491
  • Title

    Wideband EM coupler/applicator design and characterization for the clinical benchmarking tests of microwave stethoscope (MiSt)

  • Author

    Huang, Gui Chao ; Gagarin, Ruthsenne ; Celik, Nuri ; Youn, Hyoung-Sun ; Iskander, Magdy F.

  • Author_Institution
    Hawaii Center for Adv. Commun., Univ. of Hawaii at Manoa, Honolulu, HI, USA
  • fYear
    2012
  • fDate
    8-14 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The MiSt is a novel non-invasive vital signs sensor that can simultaneously measure and extract multiple vital signs parameters including the heart rate, respiration rate, heart waveform, and changes in lung water content from a single microwave measurement. The microwave applicator used to couple the microwave signal to the patient´s chest and to measure the reflection from various body tissues play an important role in the MiSt operation for detecting multiple vital signs. In this paper, the design and characterization results of four different broadband electromagnetic couplers and their inherent tradeoffs are presented and discussed. It is shown that it is possible to achieve more than 10:1 bandwidth.
  • Keywords
    benchmark testing; biological tissues; biomedical transducers; electrocardiography; electromagnetic coupling; lung; medical signal detection; microwave detectors; microwave measurement; ECG signal; MiSt; body tissue; broadband electromagnetic coupler; clinical benchmarking testing; heart rate; heart waveform; lung water content; microwave signal coupling; microwave stethoscope; multiple vital sign parameter extraction; multiple vital sign parameter measurement; noninvasive vital sign sensor; patient chest; reflection measurement; respiration rate; single microwave measurement; wideband EM coupler-applicator design; Applicators; Couplings; Humans; Microwave communication; Microwave measurements; Muscles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4673-0461-0
  • Type

    conf

  • DOI
    10.1109/APS.2012.6349099
  • Filename
    6349099