DocumentCode :
2155765
Title :
ST-MRAM fundamentals, challenges, and applications
Author :
Andre, Torsten ; Alam, Syed M. ; Gogl, D. ; Subramanian, C.K. ; Lin, Huiming ; Meadows, W. ; Zhang, Xiaobing ; Rizzo, N.D. ; Janesky, J. ; Houssameddine, Dimitri ; Slaughter, J.M.
Author_Institution :
Everspin Technol., Austin, TX, USA
fYear :
2013
fDate :
22-25 Sept. 2013
Firstpage :
1
Lastpage :
8
Abstract :
Magnetoresistive Random Access Memory (MRAM) technology emerged from research and development into volume production within the last decade in the form of Toggle MRAM. The latest Magnetic Tunnel Junction (MTJ) based memory technology, Spin-Torque MRAM, has reached the level of customer sampling, offering higher density and bandwidth. Spin-Torque MRAM enables new applications, offers a wide range of features for use in embedded memory, and has the potential to extend to technology nodes beyond the capability of DRAM. This paper describes the devices, fundamental circuit challenges, and applications of this evolving MTJ based memory.
Keywords :
DRAM chips; MRAM devices; magnetic tunnelling; research and development; DRAM; MTJ; ST-MRAM; magnetic tunnel junction; magnetoresistive random access memory; research and development; spin-torque MRAM; volume production; Arrays; Conductors; Magnetic tunneling; Perpendicular magnetic anisotropy; Resistance; Switches; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location :
San Jose, CA
Type :
conf
DOI :
10.1109/CICC.2013.6658449
Filename :
6658449
Link To Document :
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