• DocumentCode
    2157
  • Title

    Guest Editorial Special Issue on GaN Electronic Devices

  • Author

    Ghione, G. ; Chen, Kevin J. ; Egawa, T. ; Meneghesso, Gaudenzio ; Palacios, T. ; Quay, Ruediger

  • Author_Institution
    Politecnico di Torino, Italy
  • Volume
    60
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    2975
  • Lastpage
    2981
  • Abstract
    Due to the rapid advances taking place in the development and application of GaN electronics, there is an immediate need to take cognizance of the recent technological improvements and bring the potential and opportunities that exist in the area to a wider device community. The primary goal of this special issue is, therefore, to put together works in different aspects, including modeling, design, technology, characterization and applications so that this special issue will not only be of great archival value but also attract new researchers into this area for Digital Object Identifier 10.1109/TED.2013.2278653 further accelerating the application of III-N devices in building reliable, cheaper, and high-performance electronic systems. The papers collected in this special issue have been grouped into six topics. They are: 1) Fabrication and characterization of GaN-based devices. 2) High power GaN HEMTs for power switching applications. 3) High speed GaN HEMTs for RF applications. 4) Reliability and parasitic issues in GaN HEMTs. 5) Simulation-based development of GaN HEMTs devices. 6) GaN-based low noise amplifiers and gate drive circuits.
  • Keywords
    Gallium nitride; HEMTs; Special issues and sections;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2278653
  • Filename
    6594849