High-Q dielectric resonator with operated slit: tunability, thermal stability, film measurements

Author

Eremenko, A. ; Shmigin, D. ; Pashkov, V. ; Molchanov, V. ; Poplavko, Y.

fYear

2005

fDate

12-17 June 2005

Abstract

Split dielectric resonator (SDR) of H_01δ type with a narrow slit located athwart to electric field is presented as: (1) electro-mechanically tunable DR utilizing fast piezo-actuator; (2) high-Q resonant system with thermal self-stabilization of its resonant frequency using thermal expansion for compensation; and (3) measurement device to study dielectric film parameters, including their temperature characteristics. Proposed SDR theoretical analysis based on the combination of partial regions methods and collocations, shows agreement with experimental results.

Keywords

Q-factor; dielectric measurement; dielectric resonators; dielectric thin films; electric fields; microwave measurement; dielectric film parameters; electric field; electro-mechanically tunable resonator; fast piezo-actuator; film measurements; high-Q dielectric resonator; high-Q resonant system; operated slit; resonant frequency; split dielectric resonator; thermal expansion; thermal self-stabilization; thermal stability; thin dielectric film microwave measurements; tunable dielectric resonator; Dielectric devices; Dielectric films; Dielectric measurements; Electric variables measurement; Frequency measurement; Resonance; Resonant frequency; Temperature; Thermal expansion; Thermal stability;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 2005 IEEE MTT-S International

ISSN

01490-645X

Print_ISBN

0-7803-8845-3

Type

conf

DOI

10.1109/MWSYM.2005.1516857

Filename

1516857