Title :
S-TFT: an analytical model of polysilicon thin-film transistors for circuit simulation
Author :
Yang, Gi-Young ; Kim, Yeong-Gil ; Kim, Taek-Soo ; Kong, Jeong-Taek
Author_Institution :
CAE, Samsung Electron. Co. Ltd., Kyunggi-Do, South Korea
Abstract :
This paper describes the S-TFT model developed for poly-Si TFT which improves the accuracy dramatically. The proposed model emphasis is on deriving the large parasitic resistance characteristics at low Vds by adding the junction current to the on-current. The physical-based subthreshold and off-state current model are also considered. The model guarantees the continuities of the current and the derivatives. Compared to the RPI model, known to be the best model, the proposed model improved overall simulation speed by 40-50% due to the better convergence characteristics
Keywords :
MISFET; circuit simulation; convergence; elemental semiconductors; semiconductor device models; silicon; thin film transistors; S-TFT analytical model; Si; Spice compatible model; circuit simulation; convergence characteristics; junction current; large parasitic resistance characteristics; offstate current model; on-current; physical-based model; poly-Si TFT; polysilicon TFTs; polysilicon thin-film transistors; subthreshold current model; Active matrix liquid crystal displays; Analytical models; Circuit simulation; Computer aided engineering; Equations; Grain boundaries; MOSFET circuits; P-n junctions; Research and development; Thin film transistors;
Conference_Titel :
Custom Integrated Circuits Conference, 2000. CICC. Proceedings of the IEEE 2000
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-5809-0
DOI :
10.1109/CICC.2000.852651