• DocumentCode
    2158668
  • Title

    Defect-tolerant implementation of a systolic array for two-dimensional convolution

  • Author

    Rönner, Karsten ; Hecht, Volker ; Pirsch, Peter

  • Author_Institution
    Lab. fuer Informationstechnol., Hannover Univ., Germany
  • fYear
    1991
  • fDate
    29-31 Jan 1991
  • Firstpage
    19
  • Lastpage
    25
  • Abstract
    A defect-tolerant, advanced VLSI-implementation of the two-dimensional convolution algorithm for real-time processing is presented. The chip contrasts with previously published convolution chips by its maximum mask size of 256 tabs (dividable into up to four independent masks which were applied to the same video-signal) support of adaptive filtering, on-chip delay-lines, and implemented special processing of frame-borders. Yield-enhancement techniques and architectural concepts for the design of large-area chips have been investigated and applied to the chip-design. Yield calculations show that, by the combination of new architectural concepts, effective hierarchical reconfiguration schemes, layout redundancies, and design of global parts using conservative design-rules, a high yield increase (67%) with low area overhead (6%) has been achieved
  • Keywords
    VLSI; digital signal processing chips; systolic arrays; video signals; adaptive filtering; advanced VLSI-implementation; area overhead; conservative design-rules; defect-tolerant; frame-borders; hierarchical reconfiguration schemes; large-area chips; layout redundancies; mask size; on-chip delay-lines; real-time processing; systolic array; two-dimensional convolution; video-signal; yield; Adaptive filters; Circuits; Convolution; Delay; Image processing; Laboratories; Parallel processing; Power generation economics; Redundancy; Systolic arrays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-8186-9126-3
  • Type

    conf

  • DOI
    10.1109/ICWSI.1991.151691
  • Filename
    151691