DocumentCode :
2159224
Title :
High power GaN oscillators using field-plated HEMT structure
Author :
Xu, Hongtao ; Sanabria, Christopher ; Heikman, Sten ; Keller, Stacia ; Mishra, Umesh K. ; York, Robert A.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fYear :
2005
fDate :
12-17 June 2005
Abstract :
5 GHz MMIC GaN oscillators based on AlGaN/GaN HEMTs are presented. The use of field-plated HEMT structures in these oscillators resulted in increased output power and dc-to-RF efficiency. An oscillator using an AlGaN/GaN HEMT with 0.5 mm gate width and 1.1 μm field-plate extension, biased at Vds = 40 V and Vgs = -4.5 V, delivers 1.9 W of output power with a dc-to-RF efficiency of 21.5%. Phase noise was measured to be -132 dBc/Hz at a 1 MHz offset frequency. The oscillator output power density was found to be 3.8 W/mm and is the highest yet reported. Studies of the output power, dc-to-RF efficiency, and phase noise with different field-plate extensions are also presented.
Keywords :
III-V semiconductors; MMIC oscillators; aluminium compounds; gallium compounds; integrated circuit noise; phase noise; power HEMT; wide band gap semiconductors; -4.5 V; 0.5 mm; 1 MHz; 1.1 micron; 1.9 W; 40 V; 5 GHz; AlGaN-GaN; MMIC oscillators; dc-to-RF efficiency; field-plate extensions; field-plated HEMT structure; high electron-mobility transistor; high power oscillators; monolithic-microwave integrated-circuit; phase noise; Aluminum gallium nitride; Frequency measurement; Gallium nitride; HEMTs; MMICs; Noise measurement; Oscillators; Phase measurement; Phase noise; Power generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
ISSN :
01490-645X
Print_ISBN :
0-7803-8845-3
Type :
conf
DOI :
10.1109/MWSYM.2005.1516930
Filename :
1516930
Link To Document :
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