Title :
Subwavelength imaging of plasmon superlens with 3-dimensional small surface roughness
Author :
Huang, Shaowu ; Tsang, Leung
Author_Institution :
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
Abstract :
In 2000, Pendry introduced a “perfect lens” imaging device using double negative material. He also predicted that a thin film of metal with negative permittivity (single negative material) can achieve subwavelength resolution by enhancing the p-polarization component of evanescent waves. Other advantages of developing a plasmon film lens are that noble metals are naturally available materials, the imaging process can be done in real-time, and the object can be separated from an imaging device. In 2005, a thin slab of sliver was fabricated as a superlens. Recently, we investigate the effects of small surface roughness on the images using 2-Dimensional (2-D) full wave simulations of the optical transfer function. In Bagley et al., we reported image enhancement through a superlens with roughness. It was shown that a silver film lens with small roughness compared with a wavelength can preserve image integrity and enhance the subwavelength image beyond that of a smooth lens. Next in Wang et al., we investigated the image enhancement of superlens by combining loss with roughness.
Keywords :
electromagnetic wave propagation; electromagnetic wave transmission; image enhancement; lenses; optical losses; optical transfer function; plasmons; surface roughness; 2-dimensional full wave simulations; 2D full wave simulations; 3-dimensional small surface roughness; double negative material; evanescent waves; image integrity; metal thin film; negative permittivity; noble metals; optical loss; optical transfer function; p-polarization component; perfect lens imaging device; plasmon film lens; plasmon superlens; real-time imaging; single negative material; sliver thin slab; subwavelength image enhancement; subwavelength resolution; Imaging; Lenses; Plasmons; Rough surfaces; Surface roughness; Transfer functions; Vectors;
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4673-0461-0
DOI :
10.1109/APS.2012.6349268