• DocumentCode
    2160367
  • Title

    Advanced nonlinear and active device measurements

  • Author

    Ferrero, A. ; Martens, J.

  • fYear
    2005
  • fDate
    17-17 June 2005
  • Firstpage
    1495
  • Lastpage
    1495
  • Abstract
    Presents an abstract for the session paper for the above titled paper.
  • Keywords
    Microwave devices; Microwave measurements; RF signals; Radio frequency; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2005 IEEE MTT-S International
  • Conference_Location
    Long Beach, CA
  • ISSN
    01490-645X
  • Print_ISBN
    0-7803-8845-3
  • Type

    conf

  • DOI
    10.1109/MWSYM.2005.1516975
  • Filename
    1516975
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2160367