DocumentCode :
2162671
Title :
Efficient generation of multi-parameter closed-form expressions for high-speed transmission line networks
Author :
Jerome, A. ; Rodrigues, N. ; Gunupudi, P. ; Khazaka, R. ; Nakhla, M.
fYear :
2005
fDate :
12-17 June 2005
Abstract :
Increased integration levels and higher signal speeds in microwave devices and modules have produced the need to include transmission line effects previously neglected during circuit simulation. Accurate predictions of these effects involve solution of large systems of equations, the direct simulation of which is prohibitively CPU expensive. In addition, there is a significant need for efficient and accurate analysis of components with respect to environmental effects, thermal effects, manufacturing variations and fluctuations in the critical dimensions of transmission lines. In this paper, we propose an algorithm that can efficiently extract multi-parameter closed-form expressions of the response of transmission line circuits at any output node of interest. This is achieved by the use of parameterized model reduction techniques in conjunction with neural networks. The proposed algorithm was applied to practical transmission line networks and a significant speed-up was achieved.
Keywords :
circuit simulation; integrated circuit interconnections; integrated circuit modelling; microwave integrated circuits; neural nets; reduced order systems; circuit simulation; critical dimensions; environmental effects; fluctuations effect; high-speed transmission line networks; manufacturing variations; microwave devices; microwave modules; multiparameter closed-form expressions; neural networks; parameterized model reduction; signal integrity; thermal effects; transmission line effects; Central Processing Unit; Circuit simulation; Closed-form solution; Distributed parameter circuits; Equations; Fluctuations; Manufacturing; Microwave devices; Predictive models; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
ISSN :
01490-645X
Print_ISBN :
0-7803-8845-3
Type :
conf
DOI :
10.1109/MWSYM.2005.1517066
Filename :
1517066
Link To Document :
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