Title :
A variable domain approach to reconfiguration of WSI processor arrays
Author :
Rhee, Phill K. ; Kim, Jung H.
Author_Institution :
Center for Adv. Comput. Studies, Univ. of Southwestern Louisiana, Lafayette, LA, USA
Abstract :
A novel reconfiguration algorithm for WSI (wafer scale integration) processor arrays using the concept of a variable domain is discussed. Variable domain is decided based on a fault distribution. The algorithm utilizes fault distribution information in the global assignment phase as well as in the local assignment phase. The concept of variable domain used in the algorithm overcomes the weakness of fixed domain approaches in the presence of clustered faulty cells. The number of faulty cells to be tolerated need not be predefined; thus a logical array maximizes the dimension from a given faulty physical array
Keywords :
VLSI; microprocessor chips; parallel architectures; WSI processor arrays; fault distribution; faulty cells; faulty physical array; global assignment phase; local assignment phase; reconfiguration algorithm; variable domain; Area measurement; Clustering algorithms; Length measurement; Logic arrays; Redundancy; Switches; Testing; Time measurement; Very large scale integration;
Conference_Titel :
Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9126-3
DOI :
10.1109/ICWSI.1991.151707
