DocumentCode :
2164166
Title :
Semiconductor-substrate integrated 3D-micromachined W-band helical antennas
Author :
Somjit, Nutapong ; Oberhammer, Joachim
Author_Institution :
Microsyst. Technol. Lab., KTH - R. Inst. of Technol., Stockholm, Sweden
fYear :
2012
fDate :
8-14 July 2012
Firstpage :
1
Lastpage :
2
Abstract :
This paper investigates for the first time concepts of W-band dielectric-core helix antennas which are fabricated by three-dimensional micromachining into the volume of a semiconductor (high-resistivity silicon) wafer substrate. The maximum antenna gain is achieved by free-etching the antenna but loading the core of the helical antenna with a dielectric-rod tailor-made out of the substrate, and by properly modifying the geometry of the substrate-integrated ground plane. The simulation results show that an optimized antenna concept has a return loss S11 of -22.3 dB at the nominal frequency of 75 GHz, and a 3dB-bandwidth of 2.5 GHz. For the whole band from 69 to 84 GHz, the reflection coefficient is better than -10 dB. A maximum gain of 13.2 dB and a half-power beamwidth (HPBW) of smaller than 40° are obtained for a single antenna. The front-to-back (F/B) ratio is better than 23.5 dB with an axial ratio of 0.94. An eight-element helix line array is demonstrated and has a maximum gain of 22.3 dB with a HPBW of 7° in the y-z plane and an F/B ratio of 23.71 dB.
Keywords :
dielectric-loaded antennas; helical antennas; micromachining; microwave antenna arrays; millimetre wave antenna arrays; HPBW; W-band dielectric-core helix antennas; antenna gain; dielectric-rod; frequency 69 GHz to 84 GHz; half-power beamwidth; helix line array; reflection coefficient; semiconductor wafer substrate; semiconductor-substrate integrated 3D-micromachined W-band helical antennas; substrate-integrated ground plane; three-dimensional micromachining; Arrays; Gain; Helical antennas; Loaded antennas; Silicon; Substrates; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
Conference_Location :
Chicago, IL
ISSN :
1522-3965
Print_ISBN :
978-1-4673-0461-0
Type :
conf
DOI :
10.1109/APS.2012.6349415
Filename :
6349415
Link To Document :
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