Title :
Algorithm research on automatic layout of automatic test system
Author :
He, Bai ; Hui, Lu
Author_Institution :
College of Electronic & Information Engineering, BeiHang University, Beijing, China
Abstract :
This paper proposes a new automatic layout algorithm of circuit diagram applied to automatic test system. With combining the characteristics of diagram, the algorithm implements model optimization and grading optimization of those equipments by using functions and connection information. In this paper, we use Subordination Location Algorithm based on least cross line to determine the Subordination of equipment groups and calculate the drawing geometric position of those equipment models by using Geometric Relationship Location Algorithm based on correlation information. The diagrams which are drawn out have clear hierarchy and reasonable structure.
Keywords :
Arrays; Computers; Correlation; Educational institutions; Layout; Optimization; Routing; Automatic Layout; Automatic Test System; Correlation Information; Cross Line;
Conference_Titel :
Information Science and Engineering (ICISE), 2010 2nd International Conference on
Conference_Location :
Hangzhou, China
Print_ISBN :
978-1-4244-7616-9
DOI :
10.1109/ICISE.2010.5691910