Title :
Conductor roughness reduced low-loss coplanar waveguides on low resistivity silicon by employing magnetorheological finishing
Author :
Lee, Sang-No ; Yook, Jong-Gwan ; Park, Sung-Jun ; Lee, Joon-Ik ; Kim, Yong-Jun ; Lee, Sang-Jo
Author_Institution :
Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
This paper presents a surface finishing method based on magnetorheological (MR) fluid to obtain low-loss coplanar waveguides on low resistivity silicon. CPWs with different lateral dimension but having identical 50 Ω characteristic impedance are evaluated. In addition, finite ground effects on CPW performances before and after magnetorheological finishing (MRF) are investigated. In all cases, CPWs treated with the MR fluid-based finishing method reveal much lower attenuation constants compared to original ones owing to reduced conductor roughness. The proposed MRF scheme can be applied to smoothen three dimensional high frequency structures and dramatically improve conductor roughness.
Keywords :
conductors (electric); coplanar waveguides; magnetic fluids; magnetorheology; silicon; surface finishing; surface roughness; 3D high frequency structures; 50 ohm; Si; attenuation constants; characteristic impedance; conductor roughness; finite ground effects; low loss coplanar waveguides; low resistivity silicon; magnetorheological finishing; magnetorheological fluid; surface finishing method; Attenuation; Conductivity; Conductors; Coplanar waveguides; Rough surfaces; Silicon; Surface finishing; Surface impedance; Surface roughness; Surface waves;
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
Print_ISBN :
0-7803-8845-3
DOI :
10.1109/MWSYM.2005.1517175