Title :
TCAD software for ESD on-chip protection design
Author :
Fichtner, W. ; Esmark, K. ; Stadler, W.
Author_Institution :
Integrated Syst. Lab., Eidgenossische Tech. Hochschule, Zurich, Switzerland
Abstract :
Electrostatic discharges (ESD) have always been a serious problem in the semiconductor industry. The presence of high electric fields and the amount of energy dissipated by the semiconductor devices during an ESD can give rise to electric breakdown of sensitive isolation layers as well as local melting, which leads to a latent damage or even breakdown of the whole integrated circuit (IC). One measure to prevent the breakdown of the IC is to provide the product with an adequate ESD robustness by implementing a kind of lightning conductor in the form of a protection element on the product itself. This methodology is called on-chip ESD protection.
Keywords :
circuit CAD; electrostatic discharge; integrated circuit design; semiconductor device breakdown; technology CAD (electronics); ESD; TCAD software; electric breakdown; latent damage; lightning conductor; local melting; on-chip protection design; protection element; robustness; sensitive isolation layers; Electric breakdown; Electronics industry; Electrostatic discharge; Integrated circuit measurements; Lead compounds; Lightning; Protection; Robustness; Semiconductor device breakdown; Semiconductor devices;
Conference_Titel :
Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-7050-3
DOI :
10.1109/IEDM.2001.979493