• DocumentCode
    2166294
  • Title

    Volume testing of commercial RFICs

  • Author

    Wilson, T.

  • Author_Institution
    TriQuint Semicond. Inc., Beaverton, OR, USA
  • fYear
    1994
  • fDate
    22-25 May 1994
  • Firstpage
    47
  • Lastpage
    50
  • Abstract
    Unlike the military world from which the previous generation of RFICs came, price is everything in today´s commercial arena. The strategies and equipment used to accomplish this task must be focused on this bottom line. Following this line of thought, the increased integration now available in today´s RFICs, requires that the testing be focused on the product´s functionality rather than the subcircuit´s (single function) parametrics. This strategy improves throughput, reduces cost, and most importantly guarantees that the end product meets the customer´s application requirements.<>
  • Keywords
    MMIC; automatic testing; hybrid integrated circuits; integrated circuit testing; microwave integrated circuits; monolithic integrated circuits; production testing; RF ICs; UHF IC; commercial RFICs; volume testing; Acoustical engineering; Application software; Automatic testing; Circuit testing; Costs; Hardware; Instruments; Radiofrequency integrated circuits; System testing; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Millimeter-Wave Monolithic Circuits Symposium, 1994. Digest of Papers., IEEE 1994
  • Conference_Location
    San Diego, CA, USA
  • Print_ISBN
    0-7803-1418-2
  • Type

    conf

  • DOI
    10.1109/MCS.1994.332145
  • Filename
    332145