DocumentCode :
2166941
Title :
Measurement and Modelling of MIC Components Using Conductive Lithographic Films
Author :
Shepherd, P.R. ; Taylor, C. ; Evans, P.S.A. ; Harrison, D.J.
Author_Institution :
Dept. Electronic & Elec. Eng., University of Bath, Claverton Down, Bath, BA2 7AY, U.K. Email: P.R.Shepherd@bath.ac.uk
fYear :
2001
fDate :
24-26 Sept. 2001
Firstpage :
1
Lastpage :
4
Abstract :
Conductive Lithographic Films (CLFs) have previously demonstrated useful properties in printed microwave circuits, combining low cost with high speed of manufacture. In this paper we examine the formation of various passive components via the CLF process, which enables further integration of printed microwave integrated circuits. The printed components include vias, resistors and overlay capacitors, and offer viable alternatives to traditional manufacturing processes for Microwave Integrated Circuits (MICs). Manufacturing data, measurements on test structures and equivalent circuit modelling for a range of CLF circuit structures are presented.
Keywords :
Capacitors; Circuit testing; Conductive films; Conductivity measurement; Costs; Integrated circuit measurements; Manufacturing; Microwave circuits; Microwave integrated circuits; Resistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2001. 31st European
Conference_Location :
London, England
Type :
conf
DOI :
10.1109/EUMA.2001.339160
Filename :
4140228
Link To Document :
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