DocumentCode :
2167196
Title :
Performance evaluation of bulk Si and SOI RF LDMOSFETs for emerging RFIC applications
Author :
Perupalli, P. ; Trivedi, M. ; Shenai, K. ; Leong, S.K.
Author_Institution :
Illinois Univ., Chicago, IL, USA
fYear :
1997
fDate :
6-9 Oct 1997
Firstpage :
108
Lastpage :
109
Abstract :
This paper presents the evaluation of performance of 50 V LDMOSFETS designed in bulk Si and SOI for use in power amplifiers for cellular base stations. SOI technology has been fast emerging as the major technology for RF applications due to its inherent advantages such as lower parasitics, lower on-resistance and better noise immunity. Extensive 2-D simulations on an advanced process and device simulator have been performed to study the carrier dynamics in the LDMOSFET. This allows for a better understanding of the means to reduce the device parasitics, that are a major factor limiting the RF performance of the transistor. A simple circuit model has been developed for the LDMOSFET for use in performing large signal AC analyses for RF characterization. Non-Isothermal simulations on the SOI device have shown that at the feature dimensions under consideration, the self heating does not affect the DC and RF performance significantly
Keywords :
power MOSFET; semiconductor device models; silicon-on-insulator; 2D simulation; 50 V; DC performance; RF performance; RFIC application; SOI RF LDMOSFET; Si; bulk Si RF LDMOSFET; carrier dynamics; cellular base station; circuit model; device parasitics; large signal AC analysis; noise immunity; nonisothermal simulation; on-resistance; power amplifier; self heating; Base stations; Circuit simulation; Heating; Performance analysis; Power amplifiers; RF signals; Radio frequency; Radiofrequency amplifiers; Signal analysis; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 1997. Proceedings., 1997 IEEE International
Conference_Location :
Fish Camp, CA
ISSN :
1078-621X
Print_ISBN :
0-7803-3938-X
Type :
conf
DOI :
10.1109/SOI.1997.634956
Filename :
634956
Link To Document :
بازگشت