• DocumentCode
    2167656
  • Title

    Chip-scale packaging of power devices and its application in integrated power electronics modules

  • Author

    Xingsheng Liu ; Jing, Xiuknan ; Lu, Guo-Qnan

  • Author_Institution
    Power Electron. Packaging Lab., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    370
  • Lastpage
    377
  • Abstract
    We present a power electronics packaging technology utilizing chip-scale packaged (CSP) power devices to build three-dimensional integrated power electronics modules (IPEMs). The chip-scale packaging structure, termed Die Dimensional Ball Grid Array (D2BGA), eliminates wise bonds by using stacked solder bumps to interconnect power chips. D2BGA package consists of a power chip, inner solder bumps, high-lead solder balls, and molding resin. It has the same lateral dimensions as the starting power chip, which makes high-density packaging and module miniature possible. This package enables the power chip to combine excellent thermal transfer, high current handling capability, improved electrical characteristics, and ultra-low profile packaging. Electrical tests show that the VCE(sat) and on-resistance of the D2BGA high speed insulated-gate-bipolar transistors (IGBTs) are improved by 20% and 30% respectively by eliminating the device´s wirebonds and other external interconnections, such as the leadframe. In this paper, we present the design, reliability, and processing issues of D2BGA package, and the implementation of these chip-scale packaged power devices in building 30 kW half-bridge power converter modules. The electrical and reliability test results of the packaged devices and the power modules are reported
  • Keywords
    ball grid arrays; chip scale packaging; insulated gate bipolar transistors; semiconductor device packaging; 30 kW; chip scale packaging; die dimensional ball grid array; electrical characteristics; half-bridge power converter; insulated gate bipolar transistor; power device; reliability; thermal transfer; three-dimensional integrated power electronics module; Cable insulation; Chip scale packaging; Dielectrics and electrical insulation; Electric variables; Electronic packaging thermal management; Electronics packaging; Insulated gate bipolar transistors; Power electronics; Resins; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-5908-9
  • Type

    conf

  • DOI
    10.1109/ECTC.2000.853179
  • Filename
    853179