• DocumentCode
    2168447
  • Title

    More Than Moore: GaN HEMTs and Si CMOS Get It Together

  • Author

    Kazior, Thomas E. ; LaRoche, J.R. ; Hoke, W.E.

  • Author_Institution
    Raytheon Integrated Defense Syst., Andover, MA, USA
  • fYear
    2013
  • fDate
    13-16 Oct. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Advances in silicon technology continue to revolutionize microelectronics. However, Si cannot do everything and circuits based on other materials systems are required. What is the best way to integrate these dissimilar materials and enhance the capabilities of Si, thereby continuing the microelectronics revolution? In this paper, we summarize our results on the successful integration of GaN HEMTs with Si CMOS on a common silicon substrate using an integration/fabrication process similar to a SiGe BiCMOS process. Our GaN - Si CMOS process is being scaled to 200 mm diameter wafers and integrated with scaled CMOS and used to fabricate RF and mixed signals circuits with on-chip digital control/calibration. Thus, heterogeneous integration of GaN with Si CMOS enables a new class of high performance ICs that enhance the capabilities of existing systems, enable new circuit architectures and facilitate the continued proliferation of low cost microelectronics for a wide range of applications.
  • Keywords
    BiCMOS integrated circuits; CMOS integrated circuits; HEMT integrated circuits; III-V semiconductors; elemental semiconductors; gallium compounds; silicon; wide band gap semiconductors; BiCMOS process; GaN; HEMT; RF circuits; Si; circuit architectures; fabrication process; heterogeneous integration; high performance IC; integration process; materials systems; microelectronics revolution; mixed signals circuits; on-chip digital control/calibration; scaled CMOS; silicon substrate; silicon technology; size 200 mm; CMOS integrated circuits; Gallium nitride; HEMTs; MODFETs; Radio frequency; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuit Symposium (CSICS), 2013 IEEE
  • Conference_Location
    Monterey, CA
  • Type

    conf

  • DOI
    10.1109/CSICS.2013.6659239
  • Filename
    6659239