DocumentCode
21685
Title
Application of the Feature Selective Validation Method to Pattern Recognition
Author
Ventosa, Oriol ; Pous, Marc ; Silva, Francisco ; Jauregui, Ricardo
Author_Institution
Dept. d´Eng. Electron., Univ. Politec. de Catalunya, Barcelona, Spain
Volume
56
Issue
4
fYear
2014
fDate
Aug. 2014
Firstpage
808
Lastpage
816
Abstract
Pattern recognition is a mature field; however, in recent years it has developed a special interest. Many methods have been developed exclusively focusing on this subject; all of them, however, are centered on certain types of patterns. In this paper, a new method, which aims to be as flexible as possible, is proposed. This technique is based on a validation standard method used in electromagnetic compatibility named feature selective validation. The final objective of developing the algorithm is to make it adaptable to diverse types of patterns. An application on the recognition of transient patterns is exposed as an example. Nevertheless, a wide range of other types of signals is likely to be treated with the same logic.
Keywords
electromagnetic compatibility; pattern recognition; electromagnetic compatibility; feature selective validation method application; mature field; transient pattern recognition; validation standard method; Correlation; Feature extraction; Interpolation; Pattern recognition; Shape; Transient analysis; Vectors; Computational electromagnetics method; data comparison; feature selective validation (FSV) method; pattern recognition; validation;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2013.2291494
Filename
6681968
Link To Document