• DocumentCode
    21685
  • Title

    Application of the Feature Selective Validation Method to Pattern Recognition

  • Author

    Ventosa, Oriol ; Pous, Marc ; Silva, Francisco ; Jauregui, Ricardo

  • Author_Institution
    Dept. d´Eng. Electron., Univ. Politec. de Catalunya, Barcelona, Spain
  • Volume
    56
  • Issue
    4
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    808
  • Lastpage
    816
  • Abstract
    Pattern recognition is a mature field; however, in recent years it has developed a special interest. Many methods have been developed exclusively focusing on this subject; all of them, however, are centered on certain types of patterns. In this paper, a new method, which aims to be as flexible as possible, is proposed. This technique is based on a validation standard method used in electromagnetic compatibility named feature selective validation. The final objective of developing the algorithm is to make it adaptable to diverse types of patterns. An application on the recognition of transient patterns is exposed as an example. Nevertheless, a wide range of other types of signals is likely to be treated with the same logic.
  • Keywords
    electromagnetic compatibility; pattern recognition; electromagnetic compatibility; feature selective validation method application; mature field; transient pattern recognition; validation standard method; Correlation; Feature extraction; Interpolation; Pattern recognition; Shape; Transient analysis; Vectors; Computational electromagnetics method; data comparison; feature selective validation (FSV) method; pattern recognition; validation;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2013.2291494
  • Filename
    6681968