Title :
Testing of very large systems: a hierarchical approach to fault coverage evaluation
Author :
Distante, F. ; Sami, M.G. ; Sciuto, D.
Author_Institution :
Dipartimento di Elettronica, Politecnico di Milano, Italy
Abstract :
The authors consider general, uncommitted systems whose only particular characteristic is that of affording a hierarchical, structured organization. For such systems, they propose a graph-based representation of the testing problem. First, it is seen how such representation makes it possible to define the relationship between test vectors and faults at one abstraction level: then, a multiple-level extension is introduced. This multiple-level representation is used to evaluate the limits of test coverage that can be achieved when higher levels of abstraction are used and to introduce the definition of test procedures at a high abstraction level
Keywords :
VLSI; digital integrated circuits; integrated circuit testing; abstraction level; fault coverage evaluation; graph-based representation; hierarchical approach; limits of test coverage; multiple-level extension; multiple-level representation; structured organization; test vectors; testing problem; uncommitted systems; Acceleration; Circuit faults; Circuit simulation; Circuit testing; Context modeling; Digital systems; Phased arrays; Proposals; System testing; Ultra large scale integration;
Conference_Titel :
Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9126-3
DOI :
10.1109/ICWSI.1991.151729