Enhance Profiling-Based Scan Chain Diagnosis by Pattern Masking

In prior work, profiling-based chain diagnosis methodologies were developed. This paper discusses the challenges associated with profiling-based chain diagnosis in the production test environment with limited failure buffer capacity on tester. We propose the following two pattern masking application flows to enhance diagnosis resolution in this scenario: (1) generic pattern masking and (2) adaptive pattern masking. Experimental results illustrate that pattern masking will enable profiling-based scan chain diagnosis in volume diagnosis environment.