• DocumentCode
    2170202
  • Title

    Power Supply Noise Reduction in Broadcast-Based Compression Environment for At-speed Scan Testing

  • Author

    Liang, Chun-Yong ; Wu, Meng-Fan ; Huang, Jiun-Lang

  • Author_Institution
    Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2010
  • fDate
    1-4 Dec. 2010
  • Firstpage
    361
  • Lastpage
    366
  • Abstract
    This work proposes a power supply noise reduction technique for at-speed testing in the broadcast-based test compression environment. The core technology is the X-slice creation technique, it comprises the scan-chain skew-insertion hardware and the skew configuration generation algorithm. With the created X-slices, the efficiency of X-slice filling to lower the launch cycle switching activity is improved. Effectiveness of the proposed technique is validated with ISCAS89 and ITC99 benchmark circuits.
  • Keywords
    automatic test pattern generation; circuit testing; design for testability; power supply circuits; at-speed scan testing; broadcast-based compression environment; power supply noise reduction; test compression environment; Circuit faults; Hardware; Noise; Noise reduction; Power supplies; Registers; Testing; at-speed testing; broadcast; power supply noise; test compression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2010 19th IEEE Asian
  • Conference_Location
    Shanghai
  • ISSN
    1081-7735
  • Print_ISBN
    978-1-4244-8841-4
  • Type

    conf

  • DOI
    10.1109/ATS.2010.68
  • Filename
    5692273