DocumentCode
2170449
Title
Simulation-based advanced WIP management and control in semiconductor manufacturing
Author
Miyashita, Kazuo ; Okazaki, Tsukasa ; Matsuo, Hirofumi
Author_Institution
National Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
Volume
2
fYear
2004
fDate
5-8 Dec. 2004
Firstpage
1943
Abstract
We develop a hierarchical distributed production planning and control methodology, called DISCS, for a large and unstable semiconductor manufacturing process. The upper layer of DISCS periodically optimizes work-in-process inventory (WIP) levels to meet demands and sets a target WIP level for each workstation. One of key technologies required for the purpose is a fast simulation method to make the iterative optimization process tractable. In the lower layer, dispatching decisions are made at each workstation based on its target WIP level. Computational experiments using wafer fabrication process data show that DISCS, when compared with a traditional control method, succeeds in meeting the demand while keeping lower WIP levels. This indicates that DISCS is a promising methodology for production planning and control in semiconductor manufacturing.
Keywords
production control; production planning; semiconductor device manufacture; DISCS; WIP control; WIP level; WIP management; control methodology; dispatching decisions; hierarchical distributed production planning; iterative optimization; semiconductor manufacturing; simulation method; wafer fabrication; work-in-process inventory; Computational modeling; Dispatching; Iterative methods; Manufacturing processes; Optimization methods; Optimized production technology; Production planning; Semiconductor device manufacture; Virtual manufacturing; Workstations;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference, 2004. Proceedings of the 2004 Winter
Print_ISBN
0-7803-8786-4
Type
conf
DOI
10.1109/WSC.2004.1371553
Filename
1371553
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