• DocumentCode
    2170463
  • Title

    Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points for System Test

  • Author

    Zhang, Zhaobo ; Wang, Zhanglei ; Gu, Xinli ; Chakrabart, Krishnendu

  • Author_Institution
    ECE Dept., Duke Univ., Durham, NC, USA
  • fYear
    2010
  • fDate
    1-4 Dec. 2010
  • Firstpage
    429
  • Lastpage
    432
  • Abstract
    Hardware fault-insertion test is a promising method to diagnose functional failures and target \´\´no trouble found (NTF)" problems in electronic systems. However, it is costly and impractical to equip all the potential fault sites with fault-insertion hardware. We present an optimization method to select the most effective outputs of a module where fault insertion logic must be placed to facilitate diagnosis. Faults inserted at the selected outputs are able to generate fault syndromes that are most similar to the errors produced by defects inside the module. This approach also ensures that the ambiguous fault candidates from other modules are maximally removed from the set of suspects. A fault syndrome is defined by the order of error occurrence at the observation points, and it is referred as an error flow. The similarity between two error flows is measured by the metric of edit distance. An integer linear programming model is used to maximize diagnostic effectiveness with a small number of fault-insertion points. Results on diagnostic accuracy for an open-source RISC highlight the effectiveness of the proposed method compared to a baseline random fault-insertion scheme.
  • Keywords
    boundary scan testing; fault diagnosis; integer programming; integrated circuit reliability; integrated circuit testing; linear programming; system-on-chip; diagnosis-oriented fault-insertion points; fault diagnosis; integer linear programming model; optimization method; system test; Accuracy; Circuit faults; Conferences; Dictionaries; Manufacturing; Optimization; Registers; Diagnosis-Efficient Fault Insertion Point; Error Flow; Fault-Insertion Test; Integer Linear Programming Model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2010 19th IEEE Asian
  • Conference_Location
    Shanghai
  • ISSN
    1081-7735
  • Print_ISBN
    978-1-4244-8841-4
  • Type

    conf

  • DOI
    10.1109/ATS.2010.79
  • Filename
    5692284