• DocumentCode
    2171024
  • Title

    Determination of visco-elastic properties during the curing process of underfill materials

  • Author

    Ernst, L.J. ; van´t Hof, C. ; Yang, D.G. ; Kiasat, M.S. ; Zhang, G.Q. ; Bressers, H.J.L. ; Caers, J.F.J. ; den Boer, A.W.J. ; Janssen, J.

  • Author_Institution
    Delft Univ. of Technol., Netherlands
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1070
  • Lastpage
    1077
  • Abstract
    Thermo-setting polymers are widely used as underfill materials to improve the reliability of electronic packages. In the design phase, the influence of underfill applications on reliability is often judged through thermal and mechanical simulations, under assumed operating conditions. Because of lacking insight into the mechanical processes due to polymer curing, the impact of processing induced residual stress fields is often neglected. To investigate the evolution of stress and strain fields during the curing process it is important to assume a more appropriate starting point for subsequential process modeling. Furthermore, study of possible damage originating from the fabrication process then comes within reach. To facilitate future analysis of stress and strain fields during the curing process a cure dependent constitutive relation is assumed. An approximate investigation method for the process-dependent mechanical properties, based on DMA, is developed. As an illustration the parameter identification is performed for a selected epoxy resin
  • Keywords
    encapsulation; internal stresses; polymers; viscoelasticity; constitutive model; curing process; dynamic mechanical analysis; electronic package; epoxy resin; residual stress; thermomechanical reliability; thermosetting polymer; underfill material; viscoelastic properties; Capacitive sensors; Curing; Electronic packaging thermal management; Fabrication; Materials reliability; Mechanical factors; Parameter estimation; Polymers; Residual stresses; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-5908-9
  • Type

    conf

  • DOI
    10.1109/ECTC.2000.853302
  • Filename
    853302