DocumentCode :
2171630
Title :
A transitive closure based algorithm for test generation
Author :
Chakradhar, Srimat T. ; Agrawal, Vishwani D.
Author_Institution :
AT&T Bell Laboratories
fYear :
1991
fDate :
21-21 June 1991
Firstpage :
353
Lastpage :
358
Keywords :
Algorithm design and analysis; Circuit faults; Circuit testing; Decision making; Fault diagnosis; National electric code; Permission; Redundancy; Signal processing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
Type :
conf
Filename :
979741
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2171630
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