• DocumentCode
    2173167
  • Title

    S-Parameters Characterization of Microwave Photonics Networks

  • Author

    Abbal, Laurent ; Mollier, Jean-Claude

  • Author_Institution
    SUPAERO - 10 avenue Edouard Belin BP 4032, 31055 Toulouse Cedex 4 - France. abbal@supaero.fr
  • fYear
    2002
  • fDate
    23-26 Sept. 2002
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    As the use of opto-microwave systems having microwave modulation bandwidth is increasing, the efficient measurement of opto-electronic S-parameters will be very useful to their overall design and characterization. A new generation of tools is required for the measurement of fundamentals parameters such as the microwave frequency response, bandwidth, gain and return loss of microwave photonic components. Current lightwave measurement techniques are primitive when compared with conventional RF and microwave network analysis. A solution for accurate measurements is a system based on the development of an automated bilateral calibration which could be implemented into a millimetre network analyser (modulation frequency exceeding 20GHz) in order to fully characterize some optical and opto-electronic components. This lightwave network analysis is based on the microwave modulation response of optical components and optical fibres as lines of transmission, which require technologically compatible standards of calibration, along with an extended definition of S-parameters.
  • Keywords
    Bandwidth; Calibration; Frequency measurement; Gain measurement; Microwave generation; Microwave measurements; Microwave photonics; Optical devices; Optical modulation; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2002. 32nd European
  • Conference_Location
    Milan, Italy
  • Type

    conf

  • DOI
    10.1109/EUMA.2002.339384
  • Filename
    4140464