Title :
Crystalline structure and mechanical properties of Bi2Te 3-based profiled crystals grown by direct crystallization method
Author :
Manyakin, S.M. ; Volkov, M.P.
Author_Institution :
Crystal Co. Ltd, Korolev, Russia
Abstract :
Crystalline structure peculiarities of Bi2Te3-based thermoelectric materials grown in the form of flat plates by the direct crystallization method are examined. Values of the critical parameter (G/V)cr under which the structure perfection of growing crystals becomes poor are estimated. Experimental results of mechanical tension, compression and bending tests carried out in different crystallographic orientations are presented. It is shown that the mechanical characteristics of materials are closely connected with crystalline structure
Keywords :
bending; bismuth compounds; compressive testing; crystal growth from melt; crystal structure; crystallisation; semiconductor growth; semiconductor materials; tensile testing; thermoelectricity; Bi2Te3; Bi2Te3-based thermoelectric materials; bending tests; compression tests; critical parameter; crystalline structure; crystallographic orientation; direct crystallization method; flat plates; mechanical characteristics; mechanical properties; mechanical tension tests; profiled crystals; structure perfection; Bismuth; Constitution; Crystalline materials; Crystallization; Crystallography; Mechanical factors; Tellurium; Temperature; Testing; Thermoelectricity;
Conference_Titel :
Thermoelectrics, 2001. Proceedings ICT 2001. XX International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-7205-0
DOI :
10.1109/ICT.2001.979838
