• DocumentCode
    2174629
  • Title

    Study of micro-scale limits of solder self-assembly for MEMS

  • Author

    Harsh, K.F. ; Bright, V.M. ; Lee, Y.C.

  • Author_Institution
    Dept. of Mech. Eng., Colorado Univ., Boulder, CO, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1690
  • Lastpage
    1695
  • Abstract
    Solder self-assembly of MEMS has been shown to be an excellent approach for assembling three-dimensional MEMS structures by allowing more precise alignments and vastly increased complexity. This paper investigates if solder self-assembly could be applied at the sub-micron scale. Experiments studying the surface energy minimization properties of molten solder demonstrate that surface energy minimized solder spheres as small as 5 nm are possible. However, the intermetallic formation may limit our ability to reach the nano-scales. Nevertheless, even with intermetallic formation, it should be possible to use solder self-assembly at sub micron scale
  • Keywords
    micromechanical devices; self-assembly; soldering; surface energy; MEMS; intermetallic compound formation; solder self-assembly; surface energy minimization; three-dimensional structure; Assembly; Chemical technology; Electronic packaging thermal management; Electronics packaging; Intermetallic; Manufacturing; Microelectromechanical devices; Micromechanical devices; Self-assembly; Surface tension;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-5908-9
  • Type

    conf

  • DOI
    10.1109/ECTC.2000.853447
  • Filename
    853447