DocumentCode
2175992
Title
HLS-l: High-level synthesis of high performance latch-based circuits
Author
Paik, Seungwhun ; Shin, Insup ; Shin, Youngsoo
Author_Institution
Dept. of Electr. Eng., KAIST, Daejeon
fYear
2009
fDate
20-24 April 2009
Firstpage
1112
Lastpage
1117
Abstract
An inherent performance gap between custom designs and ASICs is one of the reasons why many designers still start their designs from register transfer level (RTL) description rather than from behavioral description, which can be synthesized to RTL via high-level synthesis (HLS). Sequencing overhead is one of the factors for this performance gap; the choice between latch and flip-flop is not typically taken into account during HLS, even though it affects all the steps of HLS. HLS-l is a new design framework that employs high-performance latches during scheduling, allocation, and controller synthesis. Its main feature is a new scheduler that is based on a concept of phase step (as opposed to conventional control step), which allows us scheduling in finer granularity, register allocation that resolves the conflict of latch being read and written at the same time, and controller synthesis that exploits dual-edge triggered storage elements to support phase step based scheduling. In experiments on benchmark designs implemented in 1.2 V, 65 -nm CMOS technology, HLS-l reduced latency by 16.6% on average, with 9.5% less circuit area, compared to the designs produced by conventional HLS.
Keywords
CMOS integrated circuits; application specific integrated circuits; benchmark testing; flip-flops; high level synthesis; network interfaces; optimising compilers; scheduling; ASICs; CMOS technology; benchmark designs; controller synthesis; dual-edge triggered storage elements; flip-flop; high-level synthesis; latch-based circuits; phase-step based scheduling; read-and-written latch; register allocation; register transfer level; sequencing overhead; size 65 nm; voltage 1.2 V; CMOS technology; Circuit synthesis; Clocks; Delay; Flip-flops; High level synthesis; Latches; Microarchitecture; Signal generators; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location
Nice
ISSN
1530-1591
Print_ISBN
978-1-4244-3781-8
Type
conf
DOI
10.1109/DATE.2009.5090830
Filename
5090830
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