• DocumentCode
    2176503
  • Title

    Superior reliability prediction in design and development phase

  • Author

    Kanapady, R. ; Adib, R.

  • Author_Institution
    MSCWorks Inc., Campbell, CA, USA
  • fYear
    2013
  • fDate
    28-31 Jan. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    High demanded reliable components or systems projects necessitate reliability prediction in early design and development phase. Historically reliability predictions are performed using standardization of the technique such as MIL-HDBK-217 or similar handbook, which in many cases has produced inaccurate reliability results. Today´s complex designs, which have intricate interfaces and boundaries, cannot rely on these methods to predict reliability. This paper presents superior reliability prediction approach for design and development of projects that demands high reliability where traditional prediction approach has failed to do the job. The effectiveness of the proposed approach is illustrated with a suitable example of solder ball failures on a silicon chip and circuit board. Reliability of solder ball has been accurately predicted. Sensitivity analysis, which determines factors that can mitigate or eliminate the failure mode(s) has been performed. Probabilistic analysis such as the burden capability method is employed for assessing the probability of failure mode occurrences, which provides a structured approach to ranking of the failure modes, based on a combination of their probability of occurrence and severity of their effects. The effective number of simulation runs for various random variables and how to compute the life is also presented.
  • Keywords
    product design; product development; reliability; sensitivity analysis; statistical analysis; burden capability method; circuit board; failure mode occurrence; probabilistic analysis; project design phase; project development phase; sensitivity analysis; silicon chip; solder ball failure; solder ball reliability; superior reliability prediction approach; Load modeling; Materials; Predictive models; Reliability engineering; Sensitivity; Strain; BGA; Ball Grid Array; Modeling; Probabilistic; Reliability; Simulation; Solder joint; electronic devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
  • Conference_Location
    Orlando, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4673-4709-9
  • Type

    conf

  • DOI
    10.1109/RAMS.2013.6517621
  • Filename
    6517621