Title :
Analyzing the impact of substrate noise on embedded analog-to-digital converters
Author :
Zinzius, Yann ; Gielen, Georges ; Sansen, Willy
Author_Institution :
Dep. Elektrotechniek, Katholieke Univ., Leuven, Belgium
Abstract :
This paper presents the analysis and measurements of the impact of digital substrate noise on embedded Analog-to-Digital converters. The impact of substrate noise on analog design is explained, followed by a specific entire impact analysis of the impact on a regenerative comparator and an A/D converter. To confirm the analysis the substrate noise has also been measured on a test chip designed in a 0.35 μm heavily-doped-substrate CMOS technology. From the measurements it was deduced that SNR and the effective number of bits are reduced by 20%.
Keywords :
CMOS integrated circuits; analogue-digital conversion; comparators (circuits); integrated circuit noise; jitter; system-on-chip; 0.35 micron; A/D converter; MOS transistor model; SNR; SoC; analog design; analog-to-digital converters; digital substrate noise; embedded ADCs; equivalent output signal jitter; heavily-doped-substrate CMOS technology; regenerative comparator; Analog-digital conversion; CMOS technology; Circuit noise; Equations; MOSFETs; Noise generators; Noise measurement; Semiconductor device measurement; Topology; Voltage;
Conference_Titel :
Circuits and Systems for Communications, 2002. Proceedings. ICCSC '02. 1st IEEE International Conference on
Print_ISBN :
5-7422-0260-1
DOI :
10.1109/OCCSC.2002.1029050
